Evolution of the graphite surface in phosphoric acid: an AFM and Raman study

• Rossella Yivlialin,
• Luigi Brambilla,
• Gianlorenzo Bussetti,
• Matteo Tommasini,
• Andrea Li Bassi,
• Carlo Spartaco Casari,
• Matteo Passoni,
• Franco Ciccacci,
• Lamberto Duò and
• Chiara Castiglioni

Beilstein J. Nanotechnol. 2016, 7, 1878–1884, doi:10.3762/bjnano.7.180

• spectroscopy investigation. Keywords: atomic force microscopy (AFM); electrochemical atomic force microscopy (EC-AFM); electrochemical delamination of graphite; graphene; phosphoric acid; Raman spectroscopy; Introduction Sulfuric (H2SO4), perchloric (HClO4) and phosphoric (H3PO4) acid in aqueous solutions